XAFS and XES are versatile elementally-selective techniques that offer insight into key material properties. These techniques are widely used across the sciences, from identifying minerals to evaluating device performance. Over the past 50 years, XAFS and XES have been largely restricted to large-scale synchrotron facilities. While these facilities offer high-flux and energy resolution, the limited number of synchrotrons worldwide restricts access to XAFS and XES. By bringing research-grade measurements into the laboratory, EasyXAFS instruments offer to propel materials testing.